Serving  Our Guest Log in    RegisterHow to post your own listings   View prices in  or ...    
ALL CATEGORIES   Inspection Equipment   Optical Inspctn Eqpt   Microscopes    View    Search-by-Specs    Input    Edit    
View All Offers Under

Critical Dimension Scanning Electron Microscopes


» Switch Major Category
Click an item's ID# below for its full specifications and source, or:

List other sub-categories under MicroscopesList other sub-categories under Microscopes

Show other product types under MicroscopesShow other product types under Microscopes


  • To sort on a column, click the column head; click it again to reverse the sort.  View measures in specified units, or  click to change units of measureMetric  click to change units of measureUS
  • Hide photos, compress data table
Item IDPhotoItem DescriptionSize RangeResolution ÅCD Measure RangeCass to CassTilt Stage#PriceNotes Location
MakeModelSet SizeMinMax
(Å)(µm)(µm)$
180474
Applied Materials NanoSEM 3D300 mm1 F*East Fishkill, NY
180514
Applied Materials NanoSEM 3D300 mm1 F*East Fishkill, NY
189511
Applied Materials Semvision CX200 mm1 F*Burlington, Vermont
35762
Hitachi S-7000150 mm150.000.10200.00YESYES1 F*Plano, TX
178287
Hitachi S-78001 F*Singapore,
195362 Hitachi S-93801 N*Taichung, Taichung City
77955
JEOL JWS-7505ZH80.00YES1 F*Plano, TX

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Critical Dimension Scanning Electron Microscopes:
Applied Materials, Inc., Hitachi, JEOL