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Critical Dimension Scanning Electron Microscopes


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Item IDItem DescriptionSize RangeResolution ÅCD Measure RangeCass to CassTilt Stage#PriceNotes Location
MakeModelSet SizeMinMax
(Å)(µm)(µm)$
180474 Applied Materials NanoSEM 3D300 mm 1 F* East Fishkill, NY
180514 Applied Materials NanoSEM 3D300 mm 1 F* East Fishkill, NY
189511 Applied Materials Semvision CX200 mm 1 F* Burlington, Vermont
35762 Hitachi S-7000150 mm150.000.10200.00YESYES 1 F* Plano, TX
178287 Hitachi S-7800 1 F* Singapore,
195362 Hitachi S-9380 1 F* Singapore,
77955 JEOL JWS-7505ZH80.00YES 1 F* Plano, TX

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Critical Dimension Scanning Electron Microscopes:
Applied Materials, Inc., Hitachi, JEOL