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Critical Dimension Scanning Electron Microscopes

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  • Item IDItem DescriptionSize RangeResolution ÅCD Measure RangeCass to CassTilt Stage#PriceNotes Location
    MakeModelSet SizeMinMax
    180474 Applied Materials NanoSEM 3D300 mm1 F*East Fishkill, NY
    180514 Applied Materials NanoSEM 3D300 mm1 F*East Fishkill, NY
    189511 Applied Materials Semvision CX200 mm1 F*Burlington, Vermont
    35762 Hitachi S-7000150 mm150.000.10200.00YESYES1 F*Plano, TX
    178287 Hitachi S-78001 F*Singapore,
    77955 JEOL JWS-7505ZH80.00YES1 F*Plano, TX
    191527 KLA-Tencor 8100XP1 F*N*Singapore,

       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Critical Dimension Scanning Electron Microscopes:
    Applied Materials, Inc., Hitachi, JEOL, KLA-Tencor