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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
190444
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00101DA-01


2006 DOM

Still in the fab, warm idle
190445
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00103CB-01

DOM: 2006

190446
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00101GB-01

DOM: 2007

178308
Accretech  

Accretech  

Win-Win 50 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Taichung, Taichung City
Accretech, Win-Win 50,Bright Field Inspection, 300mm:
Manufactured in 2005; Status: Bagged and Skidded


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
196277
Acton Research Corpo  

Acton Research Corpo  

SpectraPro 300i 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Scotia, New York
ACTON RESEARCH TRIPLE-GRATING MONOCHROMATOR/SPECTROGRAPH:
Triple-Grating Monochromator/Spectrograph
111048
American Optical  

American Optical  

1177-1 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

2 195.00 F* Scotia, NY
AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
1895
American Optical  

American Optical  

570 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 525.00 Scotia, NY
AMERICAN OPTICAL STEREO MICROSCOPE 7X - 42X:
Stereo Zoom Microscope

(stand not included)

 

1894
American Optical  

American Optical  

580 

List all items of this typeStereo Microscopes

in Optical Microscopes

2 550.00 Scotia, New York
AMERICAN OPTICAL STEREO ZOOM MICROSCOPES 10X - 60X:
Stereo Zoom Microscope

(stand and arm not included)

 

864
Ametek  

Ametek  

List all items of this typeMechanical Inspection Equipment - Other

in Mechanical Inspection Equipment

2 2,100.00 F* Scotia, NY
AMETEK DEADWEIGHT TESTER:
Dead Weight Tester

171583
Anatech Ltd  

Anatech Ltd  

Hummer 6.6T 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, NY
ANATECH HUMMER 6.6T SPUTTER SYSTEM:
Sputter System
554
Anorad  

Anorad  

IBM6225 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Scotia, NY
ANORAD PRECISION X-Y-Z INSPECTION MEASUREMENT SYSTEM:
Precision X-Y-Z Inspection Measurement System

System mounted on granite table

180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

178309
AMAT  

AMAT  

Complus 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Singapore,
Applied Materials, Complus, Particle Measurement, 300mm:
Manufactured in 2007; Status: Bagged and Skidded

MULTIPLE UNITS AVAILALBE!!! Please inquire.
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
178310
AMAT  

AMAT  

Uvision 200 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Applied Materials, Uvision 200, Bright Field Inspection, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
196827
ASML  

ASML  

AT 850 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   East Fishkill, New York
ASML AT-850, 300mm, KrF 248nm Scanner:

 

ASML AT-850D, 300mm, KrF 248nm Scanner, 

S/N : m5946

Known Tool Issues:
Currently power off with Lens gas flowing, tool had issue with illumination rack that will require replacement.  The tool currently has all of the parts present, but they have not necessarily been calibrated or setup with the tool being off.  Laser has 104.5 Billion pulses on it.  Components were good when shutdown.
The Beam steering hardware in not functional, and the ACC needs an heat exchanger installed

 

Tool ID: GB03

197858
ASML  

ASML  

TWINSCAN XT:850F 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Veldhoven, North Brabant
ASML, XT: 850F, 300mm, KrF, :
ASML, TWINSCAN XT:850F, 300mm, KrF, 

S/N: m7691

Laser model CYMER ELS-7610K (40W)
MES machine type XT850F
OIU/Reticle-/Waf.aux.port Right Configuration
Power 400 Volt

In warehouse stored.

184614
ATM GmbH  

ATM GmbH  

Brillant BR250.2 

List all items of this typeCut-Off Saws

in Sample Preparation

1   F* Scotia, NY
ATM GmbH CUT OFF SAW 12" :
Cut-Off Saw
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

110163
BAL-TEC  

BAL-TEC  

SCD 050 

List all items of this typeSample Coaters

in Sample Preparation

1   Scotia, New York
BAL-TEC SAMPLE COATER/SPUTTER COATER SEM SAMPLE PREP:
Sputter Coater
1786
Bausch & Lomb  

Bausch & Lomb  

Type A 

List all items of this typeStands

in Parts and Accessories, Microscope

13 185.00 Scotia, NY
BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:
Type A Incident Light Stand

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
1785
Bausch & Lomb  

Bausch & Lomb  

312690 

List all items of this typeParts and Accessories - Other

in Parts and Accessories, Microscope

10 180.00 F* Scotia, New York
BAUSCH & LOMB ER-ARM:
ER-Arm

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
964
Bausch & Lomb  

Bausch & Lomb  

MicroZoomII 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1 4,000.00 Scotia, NY
BAUSCH & LOMB MICROSCOPE WORK STATION:
Microscope Work Station

Long working distance objectives

 

146
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

248
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope with Camera
3264
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 1 

List all items of this typeStereo Microscopes

in Optical Microscopes

13 225.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:
Stereo Zoom Microscope

Microscopes listed are for pod and eyepieces only

 

110365
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 2 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 350.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 2X:
Stereo Zoom Microscope

 



Microscopes listed are for pod and eyepieces only

 

145
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 7X - 30X:
Stereo Zoom Microscope

Pod color may vary
Microscopes listed are for pod and eyepieces only

 

1800
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 5 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 600.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

159266
Bausch & Lomb  

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb Stereo Zoom 4:
StereoZoom 4 Microscope with Boom Stand
161016
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 4:
Microscope on Small Base
161018
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb StereoZoom 6 Plus:
Microscope Head
159267
Bausch & Lomb  

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 6-ST:
StereoZoom Microscope with Boom Stand
157435
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
BAUSCH & LOMB StereoZoom 7:
Microscope & Boom Stand
110364
Bausch & Lomb  

Bausch & Lomb  

Type K 

List all items of this typeStands

in Parts and Accessories, Microscope

1 235.00 Scotia, NY
BAUSCH & LOMB TYPE K STAND:
K Stand for B&L StereoZoom Microscopes

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
E-Arm not included
109598
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

4 300.00 Scotia, NY
BOOM STAND:
Table Clamp Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109648
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109553
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109554
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109122
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

19 350.00 F* Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109425
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

6 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rectangular Horizontal Post

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109427
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Dual Arm Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109549
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rotatable Knuckle

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
178063
Brown & Sharpe  

Brown & Sharpe  

MicroXcel 7105 

List all items of this typeCoordinate Measuring Machines - Other

in Coordinate Measuring Machines

1   F* Scotia, New York
BROWN & SHARPE COORDINATE MEASURING MACHINE:
Coordinate Measuring Machine
195987
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   Singapore,
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology


199447
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology
155948
Brunson Instrument  

Brunson Instrument  

81 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Scotia, NY
BRUNSON INSTRUMENT ALIGNMENT TELESCOPE:
Alignment Telescope


Tripod in photo is representative; actual tripod has yellow legs and grey top
185800
Buehler  

Buehler  

SimpliMet 1000 

List all items of this typeMounting Press

in Sample Preparation

1 4,950.00 F* Scotia, NY
BUEHLER AUTOMATIC MOUNTING PRESS 1" TO 2" CAPACITY:
Automatic Mounting Press
23007
Buehler  

Buehler  

Carbimet Paper Discs 

List all items of this typeSample Preparation - Other

in Sample Preparation

2 50.00 F* Scotia, NY
BUEHLER CARBIMET 320 GRIT PAPER DISCS:
Paper Discs 320 Grit

Buehler part number: 30-5108-320-100
4436
Buehler  

Buehler  

Consumables 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

4   Scotia, NY
BUEHLER CONSUMABLES, POLISHING AND GRINDING:
Polishing and Grinding Consumables
122523
Buehler  

Buehler  

Dressing Chuck 

List all items of this typeCut-Off Saws

in Sample Preparation

2 185.00 F* Scotia, NY
BUEHLER ISOMET DRESSING CHUCK:
Dressing Chuck

142877
Buehler  

Buehler  

ISOMET 

List all items of this typeCut-Off Saws

in Sample Preparation

4 3,350.00 F* Scotia, New York
BUEHLER LOW SPEED CUT-OFF SAW:
Precision Sectioning Saw

Representative photo - color of saw may vary

Various ISOMET chucks available. 
See other information for more details.
116574
Buehler  

Buehler  

Primet 

List all items of this typeSample Preparation - Other

in Sample Preparation

1 650.00 F* Scotia, NY
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:
Modular Dispensing Satellite

147703
Buehler  

Buehler  

48-1573GGG-R 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1 3,850.00 F* Scotia, NY
BUEHLER THREE POSITION POLISHING BENCH :
Three Position Polishing Bench

178410
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Ecomet-3000 Polisher, 300mm:
Status: Bagged and Skidded
178407
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, Ecomet-3000 300mm:
Status: Bagged and Skidded
178409
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, 300mm:
Status: Bagged and Skidded
16091
Clark  

Clark  

S8A 

List all items of this typeHardness Testers

in Mechanical Inspection Equipment

1 1,200.00 F* Scotia, NY
CLARK MICROHARDNESS TESTER:
Microhardness Tester
173380
Coborn  

Coborn  

PS1 (PS-1) 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Leominster, Massachusetts
Coborn Planetary Skive Bench for Diamond Faceting & Polishing:

Coborn Planetary Skive (Scaif) Bench for Faceting and Polishing single-crystal diamond (SCD).  Equipped with 24x36 inch table, 3-phase fixed speed spindle, and an additional planetary motion functionality.

  • Engineered to polish and/or finish single-crystal diamond (SCD) materials including cutting tools, gemstones, and substrates for scientific research.
  • Planetary motion can improve diamond removal rates, polished surface finish, and/or edge quality especially on difficult-to-polish SCD (CVD, HPHT, or Natural).  The relative motion of the wheel and SCD workpiece also minimizes uneven wear of "tracks" in the ferrous skive wheel/plate.
  • The system design offered can be operated with or without planetary motion.
  • Refurbishment includes a new charcoal gray laminated top applied to a thick steel tabletop. 
  • Goods to be sold in tested, refurbished condition with a limited warranty to ensure functionality. 
  • PHOTO NOTE: The unit shown in the attached images has been sold.  However, refurbishment of a similar Coborn unit is ongoing.  Photos of actual unit offered can be provide prior to sale.
165713
Coborn  

Coborn  

SK-KKAS  

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Sterling, Massachusetts
Coborn SK-KKAS Skive Spindle (1.5kW):
  • This used, operational Coborn SK-KKAS Scaif (Skive) Spindle is only being offered as part of an integrated (non-planetary) skive bench for Polishing & Faceting Single Crystal Diamond:
    • Height-Adjustable Nose (Z position of spindle nose).
    • Includes Coborn Airflow Bowl option (for dust collection below spindle).
    • Includes Coborn Expanding Nose option (replaceable "collet").
    • Wired to enable variable spindle speed.
  • Both new and used sturdy bench options can be considered.  Variable speed spindle controls can also be considered.
  • This 3-Phase spindle was previously tested at Cline Innovations.  The spindle will be re-tested after final integration into a complete bench. 
6410
Cognex  

Cognex  

900C 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

2   Scotia, NY
COGNEX PC BASED MACHINE VISION SYSTEM:
PC Based Machine Vision System

Cognex Checkpoint 900C is the ideal choice for applications requiring color image processing. The systems high-accuracy color vision tools are able to reliably recognize subtle differences in parts that would go unrecognized by grey-scale vision systems. Typical applications include sorting pharmaceutical tablets by color and color verification of LEDs and keys on mobile phones.

7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
28680
Dage-MTI  

Dage-MTI  

SERIES 68 

List all items of this typeCameras and Controllers

in Optical Microscopes

2 1,200.00 Scotia, NY
DAGE-MTI SERIES 68 INFRARED CAMERA:
Infrared Camera
1901
Davidson Optronics  

Davidson Optronics  

D571 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1 650.00 Scotia, NY
DAVIDSON OPTRONICS ADJUSTABLE MIRROR:
6" Adjustable Mirror
194899
DELTRONIC  

DELTRONIC  

DH14-RR 

List all items of this typeMeasuring Microscopes

in Optical Microscopes

1   Plano, Texas
Deltronic DH14-RR Profile Projector :
Deltronic DH14-RR Profile Projector 
  • 20X Objective Lens
194900
Denton  

Denton  

Desk II 

List all items of this typeSample Coaters

in Sample Preparation

1   Plano, Texas
Denton Desk II SEM Sample Coater:
Denton Desk II SEM Sample Coater
  • 5.375" (dia.) X 9" (h) Chamber
  • Carbon Rod Accessory
57426
Denton  

Denton  

DESK II 

List all items of this typeSample Coaters

in Sample Preparation

1 6,250.00 F* Scotia, New York
DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :
Metal Sputter

159268
Diagnostic Instrumts  

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

2   Plano, TX
Diagnostic Instruments:
Microscope Boom Stand
86452
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-B 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Boom Stand
109548
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-A 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Weighted Base Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes

Available only with purchase of a Stereozoom Microscope
E-arm not included

43778
Diagnostic In  

Diagnostic In  

SMS20 

List all items of this typeStands

in Parts and Accessories, Microscope

1 1,075.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS SMS20:
Boom Stand

Stands can be fitted for B&L Stereo Zoom Microscopes, Leica Stereozoom Microscopes and Nikon Stereo Zoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
18711
Dolan Jenner  

Dolan Jenner  

180 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 150.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
122729
Dolan Jenner  

Dolan Jenner  

PL-750A- 111 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 225.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source

4499
Edwards  

Edwards  

S150 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, New York
EDWARDS CARBON EVAPORATION SOURCE:
Carbon Evaporation Source
181557
FEI  

FEI  

200XP TMP 

List all items of this typeFocused Ion Beam Tools

in Electron Microscopy

1   F* Scotia, New York
FEI FOCUSED ION BEAM SYSTEM:
Focus Ion Beam System

The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   N* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


134541
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, New York
FIBER OPTIC LIGHT SOURCE:
Remote Fiber Optic Illuminator

Model FOI-150-Remote
134624
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, New York
FIBER OPTIC LIGHT SOURCE:
Fiber Optic Illuminator

Manufacturer Unknown
191547
FSM  

FSM  

FSM 128 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Singapore,
FSM, 128, Film Stress Measurement Tool, 200mm:
FSM, Frontier Semiconductor Measurement, 128, Film Stress Measurement Tool, 200mm

S/N: 60920-207
175864
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, New York
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS)

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

176740
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, New York
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS).

Includes Gatan Binocular Microscope

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

175315
Gatan  

Gatan  

681 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, NY
GATAN ION BEAM COATER (IBC):
Ion Beam Coater

Ion Beam Coater (IBC) designed to produce high-quality conductive coatings on

SEM or TEM specimens
155090
GTI Graphic Tech  

GTI Graphic Tech  

EVS 2028 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1 1,200.00 Scotia, NY
GTI GRAPHIC TECHNOLOGY COLOR VIEWING STATION:
Color Viewing Station

155196
GTI Graphic Tec  

GTI Graphic Tec  

PDV-3 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

5 350.00 Scotia, NY
GTI GRAPHIC TECHNOLOGY DESK TOP VIEWING STATION:
Desk Top Viewing Station

78602
Hewlett Packard  

Hewlett Packard  

43804N 

List all items of this typeX-Ray Inspection Equipment - Other

in X-Ray Inspection Equipment

1   F* Scotia, NY
HEWLETT PACKARD HP FAXITRON X-RAY SYSTEM 110 kV:
X-Ray System

 

90649
Hewlett Packard  

Hewlett Packard  

10706B 

List all items of this typeInterferometers

in Optical Inspection Equipment

2 1,800.00 Scotia, NY
HEWLLET PACKARD 10706B:
Plane Mirror Interferometer
100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Plano, TX
Hitachi S-7000:
CD SEM Measurement Tool
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Singapore,
Hitachi, 4500 SEM, 200mm:
Manufactured in 1990
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Singapore,
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore,
Hitachi, S-7800 CD-SEM, 200mm:
Manufactured in 2008
199679
Hitachi  

Hitachi  

S-8840 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   N* Singapore,
Hitachi, S-8840, CD SEM, 200mm:
Hitachi, S-8840, CD SEM, 200mm

On Line,
In the fab,
Working

S/N: 8363-03
195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore,
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:
Hitachi, S-9380II, CD-SEM, 300mm

!!! Multiple Units Available!!!  Please Inquire
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Inspection Equipment:
Accretech, Acton Research Corporation, American Optical, Ametek, Anatech Ltd, Anorad, Applied Materials, Inc., ASML, ATM GmbH, BAL-TEC, Bausch & Lomb, Inc, Brown & Sharpe, Brunson Instrument, Buehler, Clark Material Handling Company, Coborn, Cognex, CPS, Dage-MTI, Davidson Optronics, DELTRONIC, Denton, Diagnostic Instruments, Dolan Jenner, Edwards, FEI, Fostec, FSM, Gatan, GTI Graphic Techology, Inc., Hewlett Packard, Hitachi, HSEB, Hydraulic Technology Inc., Imagexpert, Irvine Optical Company, JEOL, Karl Storz, KLA-Tencor, Kodak, Lasertech, Leco, Leica, Leica, Leitz, LMI Technologies, Macbeth, MASS-PCB, Melles Griot, Microspec, Mitutoyo, MoistTech Corp, Negevtech Ltd., Nikon, Nissei Electric Co. , Olympus, Optical Associates, Pacific Transducer Corporation, Physical Acoustics Corp, Pratt & Whitney, Precise Optics, Princeton Instruments, Prior Scientific, Ram Optical, Reichert Inc, Reichert-Jung, RK Print Coat Instruments, Rudolph Technologies, Inc., Schaevitz, Schott Fostec, SELA, Semicaps, Semprex, SOLVISION, Sony, Star Micronics, Strasbaugh, Suss MicroTec, Techniquip, Therma-Wave, Transcat, Trendcom, Tropel, Valenite Gaging Systems, Vision Engineering, Volpi, Watec, Wild, Wyler, X-Rite, Zeiss