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Your search for Manufacturer: FEI
found:
  • 15 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
181557
FEI  

FEI  

200XP TMP 

List all items of this typeFocused Ion Beam Tools

in Electron Microscopy

FEI FOCUSED ION BEAM SYSTEM:
Focus Ion Beam System

The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
1   F* Scotia, New York
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

1   East Fishkill, New York
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

1   East Fishkill, New York
202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

1   Singapore
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

1   East Fishkill, New York
203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

remarketing@surplusglobal.com

1   Malta, New York
203118
FEI  

FEI  

TEM LINK 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Link:

FEI, TEM Link

1   Malta, New York
205917
FEI  

FEI  

V600 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, V600, 4022 262 70111, Single Beam FIB, :

FEI, V600, 4022 262 70111, Single Beam FIB, 

 S/N: D3019

In Lab.  Idle

2007 Vintage.

Maintenance was done by FEI

GIS - 

Tungsten Hexacarbonyl
Iodine
Magnesium Sulfate 7-Hydrate
Xeon Difluoride GIS injector removed for tool decon!
 
 
1   East Fishkill, New York
210388
FEI  

FEI  

Micrion 2500 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Micrion 2500, FIB:

FEI, Micrion 2500, FIB

 

Installed.  Idle.

 

S/N : M2051

1   Burlington, Vermont
210390
FEI  

FEI  

Micrion 9000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Micrion 9000, FIB:

FEI, Micrion 9000, FIB

Installed.  Idle

S/N : M9023

1   Burlington, Vermont
210391
FEI  

FEI  

Micrion 2500 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Micrion 2500, FIB:

FEI, Micrion 2500, FIB

Installed.  Idle.

S/N : M2051

1   Burlington, Vermont
211893
FEI  

FEI  

TEMLINK 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Link, 14771-003, :

FEI, TEM Link, 14771-003, 

S/N : 4471-03-06

1   F* East Fishkill, New York
211894
FEI  

FEI  

CLM 3D 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

Installed.  Idle.

1   East Fishkill, New York
211546
FEI  

FEI  

Meridian-IV 

List all items of this typeScientific and Laboratory Equipment - Other

in Laboratory Equipment

FEI, Meridian-IV, Fault localization and analysis:

FEI, Meridian-IV, Fault localization and analysis

1   Singapore
206667
FEI  

FEI  

835 

List all items of this typeScientific and Laboratory Equipment - Other

in Laboratory Equipment

FEI, 835, Full Wafer Dual Beam FIB, 200mm :

FEI, 835, Full Wafer Dual Beam FIB, 200mm

Cold idle in Lab.

 

1999 Vintage

S/N : 994701

1   F* Burlington, Vermont

NOTE:
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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.