CDE ResMap 463-FOUP Resistivity Mapping Tool
CDE ResMap 463-FOUP Resistivity Mapping Tool
- For 300mm & 200mm Wafers
- Automatic Probe Head Selection
- Please Inquire for Additional Details
4 & 6 point probes are essential instruments for measuring electrical resistivity in semiconductor wafers with high precision and accuracy. These tools support advanced measurement capabilities by offering automatic probe head selection, optimizing resolution and enhancing data traceability on wafers ranging from 200mm to 300mm.
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