Ellipsometers

Ellipsometers are precision instruments used to measure the thickness and optical properties of thin films. They provide high accuracy and resolution in measurement, with features like multi-wavelength capabilities to enhance the traceability and reliability of data.

  4. KLA-TENCOR Spectra fx SWE Kit

    Ellipsometers

    KLA-TENCOR Spectra fx SWE Kit

    KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit

  5. Plasmos SD-2004 Multi-Wavelength Ellipsometer

    Ellipsometers

    Plasmos SD-2004 Multi-Wavelength Ellipsometer

    Plasmos SD-2004 Multi-Wavelength Ellipsometer
  6. Nanometrics 8300XSE Film Thickness Analyzer

    Ellipsometers

    Nanometrics 8300XSE Film Thickness Analyzer

    Nanometrics 8300XSE Film Thickness Analyzer

    • J.A. Woollam M-44 Spectroscopic Ellipsometer
    • J.A. Woollam EC-270 Ellipsometer Controller
    • J.A. Woollam LPS-420 Xenon Light Source
    • Manual Loading of up to 300mm Wafers
    • Yaskawa ERCR-NS01-B004 Motion Controller
    • Please Inquire for Additional Details

Common Applications

thin film thickness measurement

optical property characterization

multi-layer analysis

Buying Guide

Ellipsometers Buying Guide

When selecting an ellipsometer, it's crucial to focus on the precise measurement capabilities that match your application needs. Consider the specific wavelength range necessary for your analyses, as well as the required measurement resolution.

Assess the calibration and traceability documentation provided to ensure reliable and repeatable results, particularly in research or quality control environments.

  • Verify the multi-wavelength capabilities for comprehensive thin film analysis.
  • Review the measurement accuracy and resolution to match your application requirements.
  • Ensure compatibility with your existing laboratory setup and procedures.
  • Check for included accessories that support extended measurement capabilities.

Frequently Asked Questions

What are ellipsometers used for?
Ellipsometers are used to measure the thickness and optical properties of thin films with high precision and accuracy.
What specifications are important for ellipsometers?
Key specifications for ellipsometers include measurement accuracy, resolution, and multi-wavelength capabilities.
Can ellipsometers handle multi-layer film analysis?
Yes, advanced ellipsometers with multi-wavelength capabilities are designed to analyze multi-layer films effectively.
Which brands offer reliable ellipsometers?
Brands like Gaertner and Rudolph Research offer reliable ellipsometers with documented specifications.