Critical Dimension Computer Large memory digital computer calculates line widths and provides statistics on in process wafer and photomasks.

Nanometrics 8300XSE Film Thickness Analyzer

• J.A. Woollam M-44 Spectroscopic Ellipsometer
• J.A. Woollam EC-270 Ellipsometer Controller
• J.A. Woollam LPS-420 Xenon Light Source
• Manual Loading of up to 300mm Wafers
• Yaskawa ERCR-NS01-B004 Motion Controller
• Please Inquire for Additional Details