FT-IR Spectrometers

FT-IR spectrometers are sophisticated instruments used for analyzing the infrared spectra of compounds, supporting precise measurement of film thickness and material composition. These devices are equipped with capabilities such as non-destructive measurement techniques, high spectral resolution, and traceable calibration options, often including specifications like measurement of silicon epitaxial films or other materials within their spectral range.

  1. NICOLET (THERMO) FT-IR SPECTROMETER

    FT-IR Spectrometers

    NICOLET (THERMO) FT-IR SPECTROMETER

    FT-IR with Spectra-Tech Continuum Scope and TGA Interface Nicolet NEXUS 470

    Nicolet acquired by Thermo Scientific

  2. ADE Episcan 1000

    FT-IR Spectrometers

    ADE Episcan 1000

    ADE Episcan 1000 Film Thickness Measurement & Mapping Tool

    • Measurement of Epi Films <25µ
    • ON-LINE TECHNOLOGIES 2110 Spectrometer Head
    • IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler
    • ADE ACS Controller
    • Windows NT Operating System
    • Price.............................................................................$75,000.00
    • As-Is Price....................................................................$40,000.00
  3. Bio-Rad QS-500 FT-IR Spectrometer

    FT-IR Spectrometers

    Bio-Rad QS-500 FT-IR Spectrometer

    Bio-Rad QS-500 FT-IR Spectrometer

    • Transmissive & Reflective Film Measurement 
      • Si Epi Thickness, C & O in Si, BPSG Analysis
      • KBr Optical Components
      • Bio-Rad SPC 3200 Data Station
      • Upgradable to Computer Running Windows XP 
      • Bio-Rad 013-4100 Spectrometer Controller
      • Bio-Rad Stage Controller
      • Bio-Rad Robot Interface
      • Genmark Robot & Controller
  4. Bio-Rad QS-1200 FT-IR Spectrometer

    FT-IR Spectrometers

    Bio-Rad QS-1200 FT-IR Spectrometer

    BIORAD QS-1200 Automated FT-IR Spectrometer

    • Non-Destructive Measurement of Epitaxial Silicon Films
    • PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage
      • Manual Loading for up to 300mm Wafers
      • 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping
      • FTS-175 Optical Bench
        • Dynamically Tuned Beam Splitter
        • NKBr Beam Splitter
        • Dual Frequency IR Source
        • Upgraded HeNe Laser
        • System Control PC with Windows XP, 320G HD & 1G RAM
          • Win-IR Pro (Rev. 2.51) Application Software
          • QS-500 Epi (Rev. 1.31) Application Software
          • Microsoft Access Database Application
          • System Software, Applications Software & Site Preparation Manuals Included
          • Refurbished & Fully Functional
  6. Accent Optical Technologies QS-2200A FT-IR Spectrometer

    FT-IR Spectrometers

    Accent Optical Technologies QS-2200A FT-IR Spectrometer

    Accent  Optical Technologies QS-2200A FT-IR Spectrometer

    • KBR Optical Components
    • Reflective Measurement of Epitaxial Silicon Thickness
    • Automatic Wafer Handling
      • Genmark Robot with Integrated Flatfinder & Controller
      • Dual Cassette Platforms for up to 200mm Wafers
      • ACCENT Robot Interface
      • ACCENT 013-4738-2 Stage Controller
      • ACCENT 013-4758-2 AC Power Box
      • Control PC Running Windows XP OS
      • ACCENT GUI Application Software
      • SECS/GEM Interface Software

Common Applications

Silicon Epitaxial Film Analysis

Material Composition Analysis

Film Thickness Measurement

Non-destructive Testing

Buying Guide

FT-IR Spectrometer Buying Guide

When selecting an FT-IR spectrometer, it is important to consider several key factors to ensure optimal performance for your applications.

Pay attention to the spectral resolution and the range of wavelengths covered by the instrument, as these determine the capability to identify different materials accurately.

  • Ensure the spectrometer offers traceable calibration options to maintain measurement accuracy and reliability.
  • Consider the specific applications such as film thickness measurement or material composition analysis to find the right tool with appropriate functionalities.
  • Verify the instrument's compatibility with your existing systems, including any necessary interfaces or software support.
  • Look for models that provide non-destructive testing capabilities to preserve sample integrity during analysis.

Frequently Asked Questions

What materials can FT-IR spectrometers analyze?
FT-IR spectrometers can analyze a variety of materials including silicon epitaxial films, transmissive and reflective films, allowing for precise spectral analysis and composition determination.
What is the importance of spectral resolution in FT-IR spectrometers?
Spectral resolution in FT-IR spectrometers is crucial as it determines the instrument's ability to distinguish between different wavelengths, affecting the accuracy of material composition analysis.
Are FT-IR spectrometers suitable for non-destructive testing?
Yes, FT-IR spectrometers are suitable for non-destructive testing as they allow analysis of materials without altering or damaging the sample, which is essential in testing sensitive or valuable samples.
Do FT-IR spectrometers need calibration?
Yes, regular calibration is necessary for FT-IR spectrometers to ensure accuracy and traceability of measurement results, often utilizing traceable calibration standards and procedures.